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2007; 33: EE: Michael F. Siok, Jeff Tian: Empirical Study of Embedded Software Quality and Productivity. HASE 2007: 313-320: 32: EE: Nasser Alaeddine, Jeff Tian: http://www.informatik.uni-trier.de/~ley/db/indices/a-tree/t/Tian:Jeff.html ... Michael F. Siok, Jeff Tian: Empirical Study of Embedded Software Quality and Productivity. HASE 2007: 313-320 http://sunsite.informatik.rwth-aachen.de/dblp/db/indices/a-tree/s/Siok:Michael_F=.htmlMichael Siok, Jeff Tian. End-to-end defect prediction Jean-Jacques Gras, David McGaw. Reliability efficiency of defect-detection techniques: A field study http://www.issre.org/2004/program-nov3.php#sp2Siok, Jeff Tian: Empirical Study of Embedded Software Quality and Productivity. 313-320 Electronic Edition (link) BibTeX; Marc Haberkorn, Kishor S. http://www.informatik.uni-trier.de/~ley/db/conf/hase/hase2007.html#GillenRMS07DBLP Record ' conf/hase/SiokT07 ' BibTeX @inproceedings{DBLP:conf/hase/SiokT07, author = {Michael F. Siok and Jeff Tian}, title = {Empirical Study of Embedded ... http://dblp.uni-trier.de/rec/bibtex/conf/hase/SiokT07 |
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